Rotate your smartphone to landscape or increase your browser width to see session descriptions.

• Optional Tutorial
  • Beyond Sort, Burn-In, and Class Testing: Post Silicon Validation Hardware Strategy
• Welcome Reception & Dinner
• Invited Speaker
  • Jan Vardaman,TechSearch International, Inc.

• Keynote
• Michael Campbell, Qualcomm
• Technical Sessions
• High Frequency, 5G, and millimeter-wave
• Validation 1
• Advanced Packaging
• Validation 2
• System Level Test
• Validation 3
• Poster Session
• TestConX EXPO & Reception

• Distinguished Speaker
• Tawfik Arabi, Intel
• Technical Sessions
• Printed Circuit Board 1
• Market Session
• Printed Circuit Board 2
• Contact Technology
• Printed Circuit Board 3
• TestConX EXPO
• TestConX Social Event

• Technical Sessions
• Thermal
• Operations
• Awards

Program subject to change without notice.