BiTS 2018

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Sunday March 4, 2018

 

BiTS 2018 will feature two Optional Tutorials. You may register for the Tutorials and attend either or both.

Please note: attendance at the tutorials will be limited. Please sign-up early to not miss out!

Noon

Tutorial
Palo Verde Room
Optional Tutorial 1
"Testing and Selecting Thermal Interface Materials for Semiconductor Test and Burn-In "

Tutorial Mulitmedia
 
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David L. Saums
Principal & FounderPresident
DS&A LLC

Selection and proper application of thermal interface materials (TIMs) for semiconductor test and burn-in is challenging. TIMs are available in an astounding array of technologies and chemistries, types, materials, performance ranges, attachment methods, and specific application purposes. There are in fact thousands of such different thermal materials available from several hundred vendors globally. The demanding performance requirements for test and burn-in applications are highly varied and the intent of this tutorial is to provide a useful and practical understanding of TIM technology and application.

 

3:00 p

Tutorial Break

Refreshment break and networking time for Tutorial attendees.

3:30 p

Tutorial
Palo Verde Room
Optional Tutorial 2
"Connecting Your DUT to Your Tester"

Tutorial Mulitmedia
 
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Tom Bresnan
Account Manager & Technical Sales
R&D Altanova

This tutorial will be an across the board (pun intended) look at those printed wiring boards (PWBs) sitting under your socket, in your wafer probe card, or part of your test system. Our focus will be the attributes, materials and processes required to produce those test interface boards we know you’ve been dying to learn more about. We attempt to bring the board shop to you, giving you a better understanding of what you and your vendors are up against.

 

6:30 p

Welcome Reception

If this is your nineteenth time attending BiTS Workshop, only your first, or somewhere in-between you will feel welcomed at the opening reception by friends old and new.

7:30 p

Dinner

The first of many excellent meals awaits as you get to network with other industry professionals. This is a great time to catch up with old colleagues or start meeting new friends.

8:30 p

Market Session
Red Mountain Ballroom
Market Session

Everyone who attends BiTS expects to hear what’s Now & Next in test and burn-in technology. In this widely anticipated session, we go further to report on the business context of the test consumables market. First we'll hear about the technical and market forces that are shaping the future of test and burn-in. There is never a shortage of challenges due to rapid technology changes coupled with the continual need for reduced costs. Semiconductors had an exceptional year in 2017 and 2018 is shaping up to be another great year. How did socket and contactor suppliers fare? Who were the top suppliers? We’ll hear the results in the Marketplace Report. We will also take a closer look at what is happening financially in the short-term and review the long-term market drivers for test and burn-in sockets.

“Marketplace Report”
Ira Feldman
Feldman Engineering
PDF-Icon 150x139 Presentation Download
“Test and Burn-in Socket Market Update”
Lin Fu
VLSIresearch
John West
VLSIresearch
PDF-Icon 150x139 Presentation Download

9:30 p

Adjourn

Program subject to change without notice.