Best Presentation
"Contactor Based Final Test at 77 GHz on a Multi-Channel Radar Transceiver Chipset"
Brian Nakai
NXP Semiconductors
Jeffrey Finder
NXP Semiconductors
Presentation Download
Best Data
"High Current Final Test Contactor Development"
Thiha Shwe
Texas Instruments
Hisashi Ata
Texas Instruments
Kenichi Sato
Yokowo
Presentation Download
Most Inspirational
"New Possiblity with Coax Via Risers"
Matthew Priolo
Adrian Rodriquez
Christopher Kinney
Adewale Oladeinde
Intel Corporation
Presentation Download
Most Educational
"Flat Probe Technology For High Frequency Test"
Jason Mroczkowski
Xcerra
Nadia Steckler
Xcerra
Presentation Download
Attendee Choice
"Coming to terms with Burn-In sockets"
James Tong
Texas Instruments
Presentation Download
Best Poster
"Low Cost / Low Profile Spring Probe"
Samuel Pak
IWIN Co., Ltd.
Poster Download
Return to the 2017 BiTS Workshop Archive index page