TestConX Korea 2023

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Incheon, South Korea - November 7, 2023

Central Park Hotel Songdo
193, Techno Park-ro, Yeonsu-gu
Incheon, Korea, 406-840
Tel. +82-32-310-5010~1

EXPO

TestConX has, over the course of its twenty four-year history, established itself as the preeminent event for test consumables, test cell integration, and test operations. The program scope has expanded over these years from packaged semiconductor “final” test and burn-in to encompass all practical aspects of electronics testing including validation, advanced packaging testing, system level test, module test, and beyond to finished product test. 

This year is our inaugural annual TestConX Korea event!

Don’t miss this opportunity to be part of TestConX as we connect a larger community of test professionals and to participate in this excellent event!



09:00

Welcome
Welcome

“Opening Remarks”
Ira Feldman
Feldman Engineering

09:15

Session 1
Market Reports

“AI Revolutionizing Semiconductor Testing”
“์ธ๊ณต์ง€๋Šฅ(AI)์— ์˜ํ•œ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์˜ ํ˜๋ช…”
Panchami Phadke
TechInsights
Abstract - Biography (English)

The rapid advancement of Artificial Intelligence (AI) has emerged as a pivotal driving force in the semiconductor industry, fundamentally transforming the landscape of semiconductor testing. This study delves into the symbiotic relationship between AI and semiconductor testing, with a comprehensive analysis of various segments of semiconductors. Moreover, this research extends its purview to the global probe card market, accentuating region-specific insights for two key players: Korea and China.

In semiconductor testing, AI has evolved from an auxiliary tool to a central catalyst, significantly enhancing testing efficiency, accuracy, and speed. The memory segment, encompassing DRAM and flash memory, has reaped the rewards of AI-driven testing with remarkable defect detection and error prediction. Similarly, non-memory components like logic and analog devices have witnessed the infusion of AI algorithms for adaptive testing and anomaly detection, reducing production bottlenecks.

Another essential aspect of this project is the introduction of a new probe card taxonomy and re-segmentation of the Probe card market. This innovative classification promises to redefine industry standards, fostering a more coherent understanding of probe card functionalities and applications. While the global probe card market thrives, specific focus is directed towards Korea and China. These semiconductor powerhouses exhibit unique market dynamics, propelled by local demand, innovation, and strategic collaborations.

In summation, this study underscores the indispensable role of AI in propelling semiconductor testing towards unprecedented heights and global Probe card market update.

Panchami Phadke is a Market Research Analyst at TechInsights. Her primary focus is Test Connectivity Systems reports such as Probe Card, Sockets and Device Interface Boards. Part of her work focuses on the market analysis of semiconductor tests both in Memory and Non-memory markets.

She graduated from California State University, Channel Islands with a Master of Science majoring in Mathematics. She also has an MBA in Finance from Ramaiah Institute of Technology, Bengaluru. She has published a Master Thesis about using Markov Chain and Python to analyze and predict the Stock Market trend. Panchami has also published many academic papers in Indian Research Journal, SAGE Student Research Conference, etc. and presented at TestConX China 2022, TestConX 2023 at Mesa, Arizona and SW Test 2023 at Carlsbad, CA.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

์ธ๊ณต์ง€๋Šฅ(AI)์˜ ๊ธ‰์†ํ•œ ๋ฐœ์ „์€ ๋ฐ˜๋„์ฒด ์‚ฐ์—…์˜ ํ•ต์‹ฌ ๊ตฌ๋™๋ ฅ์œผ๋กœ ๋ถ€์ƒํ•˜์—ฌ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์˜ ํ™˜๊ฒฝ์„ ๊ทผ๋ณธ์ ์œผ๋กœ ๋ณ€ํ™”์‹œ์ผฐ๋‹ค. ์ด ์—ฐ๊ตฌ๋Š” AI์™€ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ๊ฐ„์˜ ์ƒ์ƒ ๊ด€๊ณ„๋ฅผ ๋‹ค๋ฃจ๋ฉด์„œ ๋‹ค์–‘ํ•œ ๋ฐ˜๋„์ฒด ์„ธ๊ทธ๋จผํŠธ์— ๋Œ€ํ•œ ์ข…ํ•ฉ์ ์ธ ๋ถ„์„์„ ์ œ๊ณตํ•œ๋‹ค. ๋˜ํ•œ ์ด ์—ฐ๊ตฌ๋Š” ๊ธ€๋กœ๋ฒŒ ํ”„๋กœ๋ธŒ ์นด๋“œ ์‹œ์žฅ์„ ์‚ดํŽด๋ณด๊ณ  ํ•œ๊ตญ๊ณผ ์ค‘๊ตญ์ด๋ผ๋Š” ๋‘ ์ฃผ์š” ํ”Œ๋ ˆ์ด์–ด์— ๋Œ€ํ•œ ํŠนํ™”๋œ ์ง€์—ญ๋ณ„ ์ธ์‚ฌ์ดํŠธ๋ฅผ ๊ฐ•์กฐํ•œ๋‹ค.

[๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์—์„œ AI๋Š” ๋ณด์กฐ ๋„๊ตฌ์—์„œ ํ•ต์‹ฌ ์ด‰์ง„์ œ๋กœ ์ง„ํ™”ํ•˜๋ฉฐ ํ…Œ์ŠคํŠธ ํšจ์œจ์„ฑ, ์ •ํ™•์„ฑ ๋ฐ ์†๋„๋ฅผ ํฌ๊ฒŒ ํ–ฅ์ƒ์‹œ์ผฐ๋‹ค. DRAM ๋ฐ ํ”Œ๋ž˜์‹œ ๋ฉ”๋ชจ๋ฆฌ๋ฅผ ํฌํ•จํ•˜๋Š” ๋ฉ”๋ชจ๋ฆฌ ์„ธ๊ทธ๋จผํŠธ์—์„œ๋Š” ๋›ฐ์–ด๋‚œ ๊ฒฐํ•จ ํƒ์ง€ ๋ฐ ์˜ค๋ฅ˜ ์˜ˆ์ธก์„ ํ†ตํ•ด AI ๊ธฐ๋ฐ˜ ํ…Œ์ŠคํŠธ์˜ ์ด์ ์„ ์–ป์—ˆ๋‹ค. ๋งˆ์ฐฌ๊ฐ€์ง€๋กœ ๋กœ์ง ๋ฐ ์•„๋‚ ๋กœ๊ทธ ์žฅ์น˜์™€ ๊ฐ™์€ ๋น„๋ฉ”๋ชจ๋ฆฌ ๊ตฌ์„ฑ ์š”์†Œ๋Š” ์ ์‘ ํ…Œ์ŠคํŠธ ๋ฐ ์ด์ƒ ํƒ์ง€๋ฅผ ์œ„ํ•œ AI ์•Œ๊ณ ๋ฆฌ์ฆ˜์˜ ๋„์ž…์œผ๋กœ ์ธํ•ด ์ƒ์‚ฐ ๋ณ‘๋ชฉ ํ˜„์ƒ์„ ์ค„์˜€๋‹ค.

์ด ํ”„๋กœ์ ํŠธ์˜ ๋˜ ๋‹ค๋ฅธ ํ•„์ˆ˜์ ์ธ ์ธก๋ฉด์€ ์ƒˆ๋กœ์šด ํ”„๋กœ๋ธŒ ์นด๋“œ ๋ถ„๋ฅ˜์ฒด์ œ์˜ ๋„์ž…๊ณผ ํ”„๋กœ๋ธŒ ์นด๋“œ ์‹œ์žฅ์˜ ์žฌ์„ธ๋ถ„ํ™”(re-segmentation)์ด๋‹ค. ์ด ํ˜์‹ ์ ์ธ ๋ถ„๋ฅ˜๋Š” ํ”„๋กœ๋ธŒ ์นด๋“œ ๊ธฐ๋Šฅ ๋ฐ ์‘์šฉ ๋ถ„์•ผ์— ๋Œ€ํ•œ ๋ณด๋‹ค ์ผ๊ด€๋œ ์ดํ•ด๋ฅผ ์ด‰์ง„ํ•˜์—ฌ ์‚ฐ์—… ํ‘œ์ค€์„ ์žฌ์ •์˜ํ•  ๊ฒƒ์œผ๋กœ ๊ธฐ๋Œ€๋œ๋‹ค. ๊ธ€๋กœ๋ฒŒ ํ”„๋กœ๋ธŒ ์นด๋“œ ์‹œ์žฅ์ด ๋ฐœ์ „ํ•˜๋ฉฐ ํŠนํžˆ ํ•œ๊ตญ๊ณผ ์ค‘๊ตญ์— ์ดˆ์ ์ด ๋งž์ถฐ์ง€๊ณ  ์žˆ๋‹ค. ์ด ๋ฐ˜๋„์ฒด ๊ฐ•๊ตญ๋“ค์€ ์ง€์—ญ ์ˆ˜์š”, ํ˜์‹  ๋ฐ ์ „๋žต์  ํ˜‘์—…์œผ๋กœ ์ธํ•œ ๋…ํŠนํ•œ ์‹œ์žฅ ์—ญํ•™๋“ค(dynamics)์„ ๋ณด์—ฌ์ค€๋‹ค.

์š”์•ฝํ•˜๋ฉด, ๋ณธ ์—ฐ๊ตฌ๋Š” ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ๋ฅผ ์ „๋ก€ ์—†๋Š” ์ˆ˜์ค€์œผ๋กœ ํ–ฅ์ƒํ•จ๊ณผ ๊ธ€๋กœ๋ฒŒ ํ”„๋กœ๋ธŒ ์นด๋“œ ์‹œ์žฅ์˜ ์ƒˆ๋กญ๊ฒŒ ๋ณ€ํ™”ํ•จ์— ์žˆ์–ด์„œ AI์˜ ํ•„์ˆ˜์ ์ธ ์—ญํ• ์„ ๊ฐ•์กฐํ•œ๋‹ค.

Panchami Phadke๋Š” TechInsights์˜ ์‹œ์žฅ ์กฐ์‚ฌ ๋ถ„์„๊ฐ€์ด๋‹ค. ๊ทธ๋…€์˜ ์ฃผ์š” ์ „๋ฌธ ๋ถ„์•ผ๋Š” ํ”„๋กœ๋ธŒ ์นด๋“œ, ์†Œ์ผ“ ๋ฐ ์žฅ์น˜ ์ธํ„ฐํŽ˜์ด์Šค ๋ณด๋“œ์™€ ๊ฐ™์€ ํ…Œ์ŠคํŠธ ์—ฐ๊ฒฐ ์‹œ์Šคํ…œ(Test Connectivity System)์ด๋‹ค. ๊ทธ๋…€์˜ ์—…๋ฌด์˜ ์ผ๋ถ€๋Š” ๋ฉ”๋ชจ๋ฆฌ ๋ฐ ๋น„๋ฉ”๋ชจ๋ฆฌ ์‹œ์žฅ ๋ชจ๋‘์—์„œ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์˜ ์‹œ์žฅ ๋ถ„์„์— ์ดˆ์ ์„ ๋งž์ถ”๊ณ  ์žˆ๋‹ค.

๊ทธ๋…€๋Š” ์บ˜๋ฆฌํฌ๋‹ˆ์•„ ์ฃผ๋ฆฝ ๋Œ€ํ•™๊ต ์ฑ„๋„์•„์ผ๋žœ๋“œ(California State University Channel Islands)์—์„œ ์ˆ˜ํ•™ ์ „๊ณต์œผ๋กœ ์„์‚ฌ ํ•™์œ„๋ฅผ ๋ฐ›์•˜๋‹ค. ๊ทธ๋…€๋Š” ๋˜ํ•œ ๋ฒต๊ฐˆ๋ฃจ๋ฃจ ๋ผ๋งˆ์ด์•„ ๊ธฐ์ˆ  ์—ฐ๊ตฌ์†Œ(Ramaiah Institute of Technology)์—์„œ ๊ธˆ์œต์ „๋ฌธ์„์‚ฌ ํ•™์œ„(MBA)๋ฅผ ์ทจ๋“ํ–ˆ๋‹ค. ๊ทธ๋…€๋Š” Markov Chain๊ณผ Python์„ ์‚ฌ์šฉํ•˜์—ฌ ์ฃผ์‹ ์‹œ์žฅ ํŠธ๋žœ๋“œ๋ฅผ ๋ถ„์„ํ•˜๊ณ  ์˜ˆ์ธกํ•˜๋Š” ๊ฒƒ์— ๋Œ€ํ•œ ์„์‚ฌ ๋…ผ๋ฌธ์„ ๋ฐœํ‘œํ–ˆ๋‹ค. Panchami๋Š” ๋˜ํ•œ Indian Research Journal, SAGE Student Research Conference ๋“ฑ์— ๋งŽ์€ ํ•™์ˆ  ๋…ผ๋ฌธ์„ ๋ฐœํ‘œํ–ˆ์œผ๋ฉฐ TestConX China 2022, TestConX 2023 at Mesa, Arizona ๋ฐ SW Test 2023 at Carlsbad, CA์—์„œ ๋ฐœํ‘œํ–ˆ๋‹ค.

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“Market Dynamics and Technology Trends Affecting Burn-in and Test Sockets”
“ ๋ฒˆ์ธ(Burn-in)๊ณผ ํ…Œ์ŠคํŠธ ์†Œ์ผ“์— ๋ฏธ์น˜๋Š” ์‹œ์žฅ ๋™ํƒœ์™€ ๊ธฐ์ˆ  ํŠธ๋ Œ๋“œ”
John West
Yole
Lin Fu
Yole
Abstract - Biography (English)

This presentation covers a lot of ground and provides a quick update of the important changes happening in the world of burn-in and test sockets.

Topics explored on the market side include acquisitions, market drivers, and the regional shifts that are reshaping the industry. From the technology perspective, the presentation explains how advanced packaging, demanding thermal test conditions, and the introduction of data analytics are adding cost and complexity to semiconductor test.

John West is a Senior Director of the Semiconductor Subsystems and Test Division at Yole Group. He has over 20 years of industry experience and a successful track record in various strategy and consulting projects. John has a Bachelor's degree in Medical Physics from King's College London and an MBA from Cranfield School of Management.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

๋ณธ ํ”„๋ ˆ์  ํ…Œ์ด์…˜์€ ๋ฒˆ์ธ ๋ฐ ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ๋ถ„์•ผ์—์„œ ์ผ์–ด๋‚˜๊ณ  ์žˆ๋Š” ์ค‘์š”ํ•œ ๋ณ€ํ™”์— ๋Œ€ํ•œ ๋งŽ์€ ๋ถ€๋ถ„์„ ๋‹ค๋ฃจ๋ฉฐ ์ตœ์‹  ์ •๋ณด๋ฅผ ์•Œ๋ ค์ฃผ๊ณ  ์žˆ๋‹ค.
์‹œ์žฅ ์ธก๋ฉด์—์„œ์˜ ํƒ๊ตฌ ์ฃผ์ œ๋“ค์€ ์ธ์ˆ˜, ์‹œ์žฅ ๋™์ธ ๋ฐ ์—…๊ณ„๋ฅผ ์žฌํŽธํ•˜๊ณ  ์žˆ๋Š” ์ง€์—ญ์  ๋ณ€ํ™”๋ฅผ ํฌํ•จํ•˜๊ณ  ์žˆ๋‹ค.
๊ธฐ์ˆ  ๊ด€์ ์—์„œ๋Š” ์ฒจ๋‹จ ํŒจํ‚ค์ง•, ๊นŒ๋‹ค๋กœ์šด ์—ด ํ…Œ์ŠคํŠธ ์กฐ๊ฑด ๋ฐ ๋ฐ์ดํ„ฐ ๋ถ„์„ ๋„์ž…์ด ์–ด๋–ป๊ฒŒ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์— ๋น„์šฉ๊ณผ ๋ณต์žก์„ฑ์„ ์ถ”๊ฐ€ํ•˜๋Š”์ง€ ์„ค๋ช…ํ•œ๋‹ค.

John West๋Š” Yole Group์˜ Semiconductor Subsystems and Test Division์˜ Senior Director์ด๋‹ค.
๊ทธ๋Š” 20๋…„ ์ด์ƒ์˜ ์—…๊ณ„ ๊ฒฝํ—˜๊ณผ ๋‹ค์–‘ํ•œ ์ „๋žต ๋ฐ ์ปจ์„คํŒ… ํ”„๋กœ์ ํŠธ์—์„œ ์„ฑ๊ณต์ ์ธ ์‹ค์ ์„ ๋ณด์œ ํ•˜๊ณ  ์žˆ๋‹ค.
John์€ King's College London์—์„œ ์˜๋ฃŒ ๋ฌผ๋ฆฌํ•™ ํ•™์‚ฌ ํ•™์œ„๋ฅผ ์ทจ๋“ํ–ˆ์œผ๋ฉฐ Cranfield School of Management์—์„œ MBA๋ฅผ ์ทจ๋“ํ–ˆ๋‹ค.

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10:15


Break & Networking

Enjoy time to meet with the presenters and network while refreshments are served.

10:45

Distinguished
Distinguished Speaker

“Necessity to Change the Structure of the Tester to Cope with the Increase in Test Cost & Space in the Future”
“์ค‘์žฅ๊ธฐ Test Cost & Space ์ฆ๊ฐ€ ๋Œ€์‘์„ ์œ„ํ•œ Tester์˜ ๊ตฌ์กฐ ๋ณ€๊ฒฝ ํ•„์š”์„ฑ”
Keumhyun "KH" Yu
Samsung Electronics
Abstract (English)

In order to respond to the increasing demand for memory and meet product requirements, the level of technical difficulty required for testers is increasing. As test-related investments and costs are expected to continue to increase, a transition to a new tester structure is necessary to reduce test costs and space. To achieve this, it is necessary to collaborate with ecosystem to find solutions for expected problems in thermal, connector, socket, and board.

์ดˆ๋ก (Korean)

๋ฉ”๋ชจ๋ฆฌ์˜ ์ˆ˜์š” ์ฆ๊ฐ€์— ๋Œ€์‘ํ•˜๊ณ  ์ œํ’ˆ์˜ ์š”๊ตฌ ์‚ฌ์–‘์„ ๋งŒ์กฑ์‹œํ‚ค๊ธฐ ์œ„ํ•ด Tester์— ์š”๊ตฌ๋˜๋Š” ๊ธฐ์ˆ  ๋‚œ์ด๋„๊ฐ€ ๋†’์•„์ง€๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ์ด์— Test ๊ด€๋ จ ํˆฌ์ž์™€ ๋น„์šฉ์ด ์ง€์† ์ฆ๊ฐ€๋  ๊ฒƒ์œผ๋กœ ์˜ˆ์ƒ๋˜๋Š” ๋ฐ”, Test Cost์™€ Space์˜ ์ ˆ๊ฐ์„ ์œ„ํ•ด ์‹ ๊ทœ Tester ๊ตฌ์กฐ๋กœ ์ „ํ™˜์ด ํ•„์š”ํ•ฉ๋‹ˆ๋‹ค. ์ด๋ฅผ ์œ„ํ•ด์„œ๋Š” Thermal, Connector, Socket ๋ฐ Board์—์„œ ์˜ˆ์ƒ๋˜๋Š” ๋ฌธ์ œ์ ์˜ ํ•ด๊ฒฐ ๋ฐฉ์•ˆ์„ ํ•จ๊ป˜ ๋ชจ์ƒ‰ํ•  ํ•„์š”๊ฐ€ ์žˆ์Šต๋‹ˆ๋‹ค.

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KH Yu headshot
์œ ๊ธˆํ˜„์€ 2002๋…„ ์‚ผ์„ฑ์ „์ž ๋ฐ˜๋„์ฒด ๋ถ€๋ฌธ ๊ณต์ฑ„๋กœ ์ž…์‚ฌํ•˜์—ฌ Memory Module Product Engineer๋กœ 12๋…„๊ฐ„ ๊ทผ๋ฌดํ•˜๋ฉด์„œ Test Program ๊ฐœ๋ฐœ ๋ฐ ๋ถˆ๋Ÿ‰ ๋ถ„์„ ์—…๋ฌด๋ฅผ ์ˆ˜ํ–‰ ํ•˜์˜€๊ณ , ์ดํ›„ 3๋…„๊ฐ„ ์ค‘๊ตญ ๋ฒ•์ธ์˜ Test Engineer๋กœ ํŒŒ๊ฒฌ ๊ทผ๋ฌด๋ฅผ ํ•˜์˜€๋‹ค. ํ•œ๊ตญ ๋ณต๊ท€ ํ›„์—๋Š” Memory Module & SSD ์ œํ’ˆ์˜ Tester ๋ฐ Infra ๊ฐœ๋ฐœ ์—…๋ฌด์™€ Test ํ˜์‹  ๋ถ€์„œ์—์„œ ๊ธฐ์ˆ ์˜ ๊ธฐํš ์—…๋ฌด๋ฅผ 6๋…„๊ฐ„ ์ˆ˜ํ–‰ํ•˜์˜€๊ณ , ์˜ฌํ•ด๋ถ€ํ„ฐ Tester ๋ฐ Infra ๊ฐœ๋ฐœ ๊ทธ๋ฃน์˜ ์—…๋ฌด๋ฅผ ์ˆ˜ํ–‰ ์ค‘์ด๋‹ค.
Keumhyun Yu joined Samsung Electronics' semiconductor division in 2002, and worked as a Memory Module Product Engineer for 12 years to develop test programs and analyze product failures. For the next 3 years, he worked as a test engineer for a Chinese subsidiary company. After returning to Korea, Memory Module & SSD Product's tester & infrastructure development and strategic planning for testing memory products were carried out for 6 years. Currently, he is a head of the Test Development Group in Test Engineering Team.



11:15

Session 2
New Technology

“Standardization of Electrical Specifcations for Test Socket Contactors”
“Test Socket์šฉ Contactor์˜ ์ „๊ธฐ์  ์‚ฌ์–‘ ํ‘œ์ค€ํ™”: ํ•„์š”์„ฑ๊ณผ ํ‘œ์ค€ํ™” ๋ฐฉ์•ˆ ์ œ์‹œ”
Elec Seo
Prowell
Abstract - Biography (English)

In this presentation, we discuss various types of contactors used in semiconductor and electronic component test sockets. These contactors come in different shapes and are manufactured through various processes, including the widely used Spring pogo pins, Elastomer, Rigid types, among others. Test engineers in semiconductor and electronic component manufacturing companies select contactor types based on the characteristics of the Device Under Test (DUT), with particular attention to their electrical properties.

The presentation provides examples and explanations of electrical specifications for different contactors. Additionally, we explore the issue of contactor suppliers presenting varying electrical specifications, even when using the same contactor and housing. Through this analysis, we aim to assist test engineers in making more objective decisions when choosing contactors.

Furthermore, we offer examples of how to determine contactor electrical specifications using Spring pogo pins, including empirical measurements and Finite Element Method (FEM) Simulation Tools. This underscores the importance of standardization in measurement and simulation methods, helping test engineers in semiconductor and electronic component manufacturing companies make more precise contactor selections.

Ultimately, this presentation seeks to provide valuable insights and guidance for both test engineers and contactor manufacturers, streamlining the process of determining electrical specifications for contactors.

  • TONGMYONG UNIVERSITY, Mechatronics Master(2007)
  • PUKYONG NATIONAL UNIVERSITY, Electrical PH.D, Candidate(2009)
  • HITACHI DECO, Tester & Handler R&D Engineer(3Y)
  • LEENO Inc, Electrical Engineer (12Y)
  • Qualmax Testech Inc, Test socket R&D Engineer (10Y)
  • Current, ISC Co.,Ltd & Prowell, Test socket R&D Engineer (4Y)

์ดˆ๋ก - ์ „๊ธฐ (Korean)

๋ณธ Presentation์—์„œ๋Š” ๋ฐ˜๋„์ฒด ๋ฐ ์ „์ž๋ถ€ํ’ˆ์šฉ Test socket์— ์‚ฌ์šฉ๋˜๋Š” ๋‹ค์–‘ํ•œ Contactor์˜ ์ข…๋ฅ˜์— ๋Œ€ํ•ด์„œ ๋‹ค๋ฃจ๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ๊ฐ€์žฅ ๋งŽ์ด ์‚ฌ์šฉ๋˜๊ณ  ์žˆ๋Š” Spring pogo pin์„ ๋น„๋กฏํ•˜์—ฌ Elastomer, Rigid type ๋“ฑ์˜ ํ˜•์ƒ๊ณผ ์ œ์กฐ๊ณต์ •์— ๋”ฐ๋ฅธ ๋‹ค์–‘ํ•œ ์ข…๋ฅ˜์˜ contactor๊ฐ€ ์‚ฌ์šฉ๋˜๊ณ  ์žˆ์œผ๋ฉฐ, ๋ฐ˜๋„์ฒด ๋ฐ ์ „์ž๋ถ€ํ’ˆ์˜ ์ œ์กฐ์—…์ฒด์˜ Test์—”์ง€๋‹ˆ์–ด๋“ค์€ DUT์˜ ํŠน์„ฑ์— ๋”ฐ๋ผ์„œ Contactor์˜ Type๋ฅผ ์„ ์ •ํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ํŠนํžˆ, ์ „๊ธฐ์  ํŠน์„ฑ์— ๋”ฐ๋ผ์„œ๋Š” ๋”์šฑ ์‹ ์ค‘ํ•œ ์„ ํƒ์ด ์ด๋ฃจ์–ด์ง‘๋‹ˆ๋‹ค.

๋ณธ Presentation์—์„œ๋Š” ๋‹ค์–‘ํ•œ Contactor์˜ electrical specification๊ณผ ๊ด€๋ จํ•˜์—ฌ ์˜ˆ์‹œ๋ฅผ ์ œ์‹œํ•˜๊ณ ,๊ฐ Specification์„ ์„ค๋ช…ํ•ฉ๋‹ˆ๋‹ค. ๋˜ํ•œ, ๋™์ผํ•œ Contactor์™€ Housing์„ ์‚ฌ์šฉํ•˜๋”๋ผ๋„ Contactor ๊ณต๊ธ‰์‚ฌ๋“ค์ด ๋‹ค๋ฅธ Electrical specification์„ ์ œ์‹œํ•˜๋Š” ๋ฌธ์ œ์— ๋Œ€ํ•ด ๊ณ ์ฐฐํ•ฉ๋‹ˆ๋‹ค. ์ด๋Ÿฌํ•œ ๊ณ ์ฐฐ์„ ํ†ตํ•ด Test ์—”์ง€๋‹ˆ์–ด๊ฐ€ ๋ณด๋‹ค ๊ฐ๊ด€์ ์ธ ํŒ๋‹จ์œผ๋กœ Contactor๋ฅผ ์„ ํƒํ•  ์ˆ˜ ์žˆ๋„๋ก ๋„์›€์„ ์ฃผ๊ณ ์ž ํ•ฉ๋‹ˆ๋‹ค.

๋”๋ถˆ์–ด, Spring pogo pin์˜ ์‹ค์ธก๊ณผ FEM Simulation Tool์„ ํ™œ์šฉํ•˜์—ฌ Contactor์˜ Electrical specification์„ ๊ฒฐ์ •ํ•˜๋Š” ๋ฐฉ๋ฒ•์˜ ์˜ˆ์‹œ๋ฅผ ์„ค๋ช…ํ•ฉ๋‹ˆ๋‹ค. ์ด๋ฅผ ํ†ตํ•ด ์ธก์ • ํ‘œ์ค€ ๋˜๋Š” ์‹œ๋ฎฌ๋ ˆ์ด์…˜ ๋ฐฉ๋ฒ•์˜ ํ‘œ์ค€ํ™”์˜ ํ•„์š”์„ฑ์„ ์ดํ•ดํ•˜๊ณ , ๋ฐ˜๋„์ฒด ๋ฐ ์ „์ž๋ถ€ํ’ˆ ์ œ์กฐ์—…์ฒด์˜ Test ์—”์ง€๋‹ˆ์–ด๊ฐ€ ๋ณด๋‹ค ์ •ํ™•ํ•˜๊ฒŒ Contactor๋ฅผ ์„ ํƒํ•  ์ˆ˜ ์žˆ๋„๋ก ๋•๊ณ ์ž ํ•ฉ๋‹ˆ๋‹ค. ๋˜ํ•œ Contactor ์ œ์กฐ์—…์ฒด๋“ค๋„ Electrical specification์„ ๊ฒฐ์ •ํ•  ๋•Œ ๊ณ ๋ฏผ์„ ๋œ์–ด์ฃผ๋Š” ํ”„๋ ˆ์  ํ…Œ์ด์…˜์„ ๋ชฉํ‘œ๋กœ ํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค.

  • ๋™๋ช…๋Œ€ํ•™๊ต ๋ฉ”์นดํŠธ๋กœ๋‹‰์Šค๊ณตํ•™ ์„์‚ฌ(2007),
  • ๋ถ€๊ฒฝ๋Œ€ํ•™๊ต ์ „๊ธฐ๊ณตํ•™ ๋ฐ•์‚ฌ๊ณผ์ • ์ˆ˜๋ฃŒ(2009)
  • HITACHI DECO, Tester & handler ๊ฐœ๋ฐœ ์—”์ง€๋‹ˆ์–ด(3๋…„)
  • LEENO INC, ์ „์ž ์—”์ง€๋‹ˆ์–ด(12๋…„)
  • Qualmax, ๊ฐœ๋ฐœ ์—”์ง€๋‹ˆ์–ด(10๋…„)
  • ํ˜„์žฌ, ISC & Prowell, Test socket ์—ฐ๊ตฌ๊ฐœ๋ฐœ ์—”์ง€๋‹ˆ์–ด(4๋…„)

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“Metal Insulator Transition Materials for Socket Applications”
“๊ณ ์„ฑ๋Šฅ ์†Œ์ผ“์šฉ ๊ธˆ์†์ ˆ์—ฐ์ฒœ์ด์†Œ์žฌ”
Hansang Kwon
Next Generation Materials Co., Ltc
Abstract - Biography (English)

The semiconductor test socket is one of the mandatory final processes for achieving a high-quality chip. There are two types of test sockets widely used: pogo pin and silicon rubber sockets. Silicon rubber socket and pogo pin types depend on the desired application target. Pogo pin type is a traditional semiconductor test method that is over 40 years used in this field. This method can flow stable electric current and a relatively good lifecycle. The silicon rubber type is developed with a micro-ball located into the silicon rubber, showing relatively good results in the short high-frequency application field.

Most test socket materials use polymeric and ceramic-based materials. The socket materials have not been very critical even though semiconductor technology is developed faster than the test socket field till now. Thanks to nanotechnology could achieve a highly integrated narrow nanosized circuit design, but it also consumed high power with high thermal concentration. Those issues could cause some side effects of the chips, such as malfunctioning when used. Due to the above reasons, the test socket field could require better-performed socket materials such as a high-power adaptive with good thermal durability.

In this study, we have successfully fabricated the metal insulator transition materials with high thermal and power adaptive semiconductor test socket materials by powder metallurgy process.

Hansang Kwon graduated with BS. and Ms. from the Department of Materials Processing, Pukyong National University in Busan Republic of Korea 2005. He got a Ph.D. from the Department of Materials Processing at Tohoku University in Sendai, Japan 2008.

He worked for The Institute for Solid State Chemistry Bordeaux-National Center for Scientific Research (ICMCB-CNRS, French national lab.) in France as a postdoc in nanocomposites from 2009-2010.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“์€ ๊ณ ํ’ˆ์งˆ ์นฉ์„ ์–ป๊ธฐ ์œ„ํ•œ ์ตœ์ข… ๊ณต์ •์— ์‚ฌ์šฉ๋˜๋Š” ํ•„์ˆ˜ ์†Œ์žฌ๋ถ€ํ’ˆ์ด๋‹ค. ์ผ๋ฐ˜์ ์œผ๋กœ ๋„๋ฆฌ ์‚ฌ์šฉ๋˜๊ณ  ์žˆ๋Š” ํ…Œ์ŠคํŠธ์šฉ ์†Œ์ผ“ ๋ฐฉ์‹์€ ํฌ๊ณ  ํ•€๊ณผ ์‹ค๋ฆฌ์ฝ˜ ๊ณ ๋ฌด๋ฅผ ํ™œ์šฉํ•˜๋Š” ํ˜•ํƒœ์ด๋ฉฐ ์ ์šฉ ๋Œ€์ƒ์— ๋”ฐ๋ผ ๊ฐ๊ฐ์˜ ๋ฐฉ์‹์˜ ์†Œ์ผ“์„ ์„ ํƒ์ ์œผ๋กœ ์‚ฌ์šฉํ•  ์ˆ˜ ์žˆ๋‹ค. ํฌ๊ณ ํ•€ ๋ฐฉ์‹์€ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ๋ถ„์•ผ์—์„œ ์•ฝ 40๋…„ ์ด์ƒ ์‚ฌ์šฉ๋˜์–ด ์˜จ ์ „ํ†ต์ ์ธ ํ…Œ์ŠคํŠธ ๋ฐฉ์‹์ด๋‹ค. ์ด ๋ฐฉ๋ฒ•์€ ์•ˆ์ •์ ์ธ ์ „๋ฅ˜๋ฅผ ํ˜๋ฆด ์ˆ˜ ์žˆ๊ณ  ์ƒ๋Œ€์ ์œผ๋กœ ์†Œ์ผ“ ์ˆ˜๋ช…์ด ๊ธด ์žฅ์ ์ด ์žˆ๋‹ค. ์‹ค๋ฆฌ์ฝ˜ ๊ณ ๋ฌด ํƒ€์ž… ์†Œ์ผ“์€ ์‹ค๋ฆฌ์ฝ˜ ๊ณ ๋ฌด ๋‚ด๋ถ€์— ๋งˆ์ดํฌ๋กœ ๋ณผ์„ ์œ„์น˜์‹œํ‚จ ํ˜•ํƒœ๋กœ ๊ฐœ๋ฐœ๋˜์—ˆ์œผ๋ฉฐ, ๋‹จ๊ฑฐ๋ฆฌ ๊ณ ์ฃผํŒŒ ์ ์šฉ ๋ถ„์•ผ์—์„œ ๋น„๊ต์  ์ข‹์€ ๊ฒฐ๊ณผ๋ฅผ ๋ณด์—ฌ์ฃผ๊ณ  ์žˆ๊ณ  ํ…Œ์ŠคํŠธ์ค‘ ๋ฐœ์ƒ๋  ์ˆ˜ ์žˆ๋Š” ์นฉ์˜ ์†์ƒ์„ ์ตœ์†Œํ™”ํ•  ์ˆ˜ ์žˆ๋Š” ์žฅ์ ์ด ์žˆ๋‹ค.

์ตœ๊ทผ ๋“ค์–ด ๋‚˜๋…ธ๊ธฐ์ˆ ์˜ ๋ฐœ์ „์œผ๋กœ ์ข…๋ž˜์˜ ํšŒ๋กœ ์„ค๊ณ„ ๋ณด๋‹ค ๋”์šฑ ๋” ๊ณ ์ง‘์ ์˜ ์นฉ ์ œ์ž‘์ด ๊ธฐ๋Šฅํ•ด์ง€๋ฉด์„œ ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ์—ญ์‹œ ์ƒ๋Œ€์ ์œผ๋กœ ๋†’์€ ์—ด ์ง‘์ค‘๋„์™€ ์ „๋ ฅ ์†Œ๋น„์— ๋Œ€ํ•œ ๋Œ€์‘์ด ํ•„์š”ํ•œ ์‹ค์ •์ด๋‹ค. ์ฆ‰, ํ…Œ์ŠคํŠธ ์†Œ์ผ“ ์—ญ์‹œ ์šฐ์ˆ˜ํ•œ ์—ด์  ๋‚ด๊ตฌ์„ฑ๊ณผ ๊ณ ์ „๋ฅ˜๋“ฑ์— ๋Œ€์‘ ๊ฐ€๋Šฅํ•œ ์†Œ์ผ“์˜ ์ ์šฉ์ด ํ•„์š”ํ•  ๊ฒƒ์ด๋‹ค.

๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” ๋ถ„๋ง ์•ผ๊ธˆ ๊ณต์ •์„ ํ†ตํ•˜์—ฌ ๊ณ ๋ฐฉ์—ด ๊ธˆ์† ์ ˆ์—ฐ ์†Œ์žฌ๋ฅผ ์ œ์กฐํ•˜๊ณ  ์ด๋ฅผ ๊ธฐ๋ฐ˜์œผ๋กœ ํ•œ ์ฐจ์„ธ๋Œ€ ๊ณ ์„ฑ๋Šฅ ๋ฐ˜๋„์ฒด ํ…Œ์ŠคํŠธ์šฉ ์†Œ์ผ“์„ ์ œ์ž‘ํ•˜์˜€๋‹ค. ํŠนํžˆ ์ œ์กฐ๋œ ๊ธˆ์†์ ˆ์—ฐ์ฒœ์ด์†Œ์žฌ๋Š” ํ‘œ๋ฉด์ €ํ•ญ ์ œ์–ด๊ฐ€ ๊ฐ€๋Šฅํ•˜์—ฌ ๋‹ค์–‘ํ•œ ์†Œ์žฌ ๋ถ€ํ’ˆ์œผ๋กœ ์‘์šฉ์ด ๊ฐ€๋Šฅํ•  ๊ฒƒ์œผ๋กœ ๊ธฐ๋Œ€๋œ๋‹ค.

โ–  ์ฃผ์š” ๊ฒฝ๋ ฅ

โ–ท ใˆœ์—”์ง€์—  (Next Generation Materials Co., Ltd.) ๋Œ€ํ‘œ์ด์‚ฌ
โ–ท ๋ถ€๊ฒฝ๋Œ€ํ•™๊ต ์‹ ์†Œ์žฌ์‹œ์Šคํ…œ๊ณตํ•™๊ณผ ๊ต์ˆ˜
โ–ท ์Šค์œ„์Šค์—ฐ๋ฐฉ์žฌ๋ฃŒ๊ณผํ•™๊ธฐ์ˆ ์—ฐ๊ตฌ์†Œ ๊ณผํ•™์ž
โ–ท ํ•œ๊ตญ์ƒ์‚ฐ๊ธฐ์ˆ ์—ฐ๊ตฌ์› ์„ ์ž„์—ฐ๊ตฌ์›
โ–ท ํ”„๋ž‘์Šค๊ตญ๋ฆฝ๊ณผํ•™์› ํฌ์Šคํ„ฐ ๋‹ฅํ„ฐ
โ–ท ์ผ๋ณธ Tohoku University ๋ฐ•์‚ฌ

โ–  ์ฃผ์š” ๋Œ€์™ธ ํ™œ๋™

โ–ท(ํ˜„)๊ฒฝ์‚ฌ๊ธฐ๋Šฅ์žฌ๋ฃŒ ๊ตญ์ œ์ž๋ฌธ์œ„์› (IACFGM)
โ–ท(ํ˜„)์ผ๋ณธ์‚ฐ์—…์ดํ•ฉ๊ธฐ์ˆ ์—ฐ๊ตฌ์†Œ(AIST) ๋น„์ƒ์ž„์—ฐ๊ตฌ์›
โ–ท(ํ˜„)๋Œ€ํ•œ๊ธˆ์†์žฌ๋ฃŒํ•™ํšŒ ๋ณตํ•ฉ์žฌ๋ฃŒ๋ถ„๊ณผ์œ„์›
โ–ท(ํ˜„)ํ•œ๊ตญ๋ณตํ•ฉ์žฌ๋ฃŒํ•™ํšŒ ์‚ฌ์—…์ด์‚ฌ
โ–ท(ํ˜„)ํ•œ๊ตญํƒ„์†Œํ•™ํšŒ ์ข…์‹ ํšŒ์›

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12:15


Lunch and EXPO

Enjoy the delicious hot buffet lunch and networking time. Then take the time to explore the TestConX EXPO. There will be many great exhibits to connect electronic test professionals to solutions. You will be certain to see something new or meet someone new. As attendees to TestConX know, there is always excellent food, drinks, and time for attendees to network with exhibitors! TestConX EXPO will open at 12:15 and will remain open throughout the afternoon until 18:00

13:30

Keynote
Keynote

“The Semiconductor Packaging Market from a Historical Perspective”
์žฅ์ง€ํ›ˆ JiHoon Jang
Gadgetseoul Media
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JiHoon Jang

๊ณ ๋„์˜ ๋ถ„์—…์ฒด๊ณ„. ๋ฐ˜๋„์ฒด ์‹œ์žฅ์˜ ์šด์˜ ๋ฉ”์ปค๋‹ˆ์ฆ˜์ด ๋งŒ๋“ค์–ด์ ธ ์˜จ ๊ณผ์ •์„ ์ฃผ๋ชฉํ•˜๊ณ , ํŒจํ‚ค์ง• ์‹œ์žฅ์˜ ๊ด€์ „ ํฌ์ธํŠธ๋“ค์„ ์งš์–ด๋ณธ๋‹ค.

์‹œ์žฅ ์ตœ์œ ๋ ฅ ๊ธฐ์—…๋“ค์˜ ๋™ํ–ฅ์„ ์ค‘์‹ฌ์œผ๋กœ ์–ด๋“œ๋ฐด๋“œ์Šค ํŒจํ‚ค์ง• ์‹œ์žฅ ํ˜„ํ™ฉ์„ ์ •๋ฆฌํ•˜๊ณ ,ย ์ด์ข…๊ตํ•ฉ์œผ๋กœ ํ–ฅํ•ด๊ฐ€๋Š” ๋ฐ˜๋„์ฒด ํ”Œ๋žซํผ์˜ ์ง„ํ™” ์–‘์ƒ๊ณผ ์žฅ๊ธฐ์ ์ธ ์‹œ์‚ฌ์ ์„ ๊ณ ์ฐฐํ•ด๋ณด๋Š” ์‹œ๊ฐ„.

We will concentrate upon the process of creating the operating mechanism of the semiconductor market and touch upon major aspects in the packaging market. We will summarize the current status of the advanced packaging market, with a focus on the trends of the leading companies in the market. This is a time to contemplate the evolving trends of semiconductor platforms heading towards Heterogeneous-integration and their long-term implications.



14:15

Session 3
Performance

“Kepler Socket - Vertical Scrubbing Test Solution”
“์ผ€ํ”Œ๋Ÿฌ ์†Œ์ผ“ - ์ˆ˜์ง ์Šคํฌ๋Ÿฌ๋น™ ํ…Œ์ŠคํŠธ ์†”๋ฃจ์…˜.”
Dexian "Frank" Liu
Smiths Interconnect
Qiaoyun "Gloria" Bao
Smiths Interconnect
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“Obstacles and Challenges on Economic SiC Power Burn-In Process”
“SiC ๋ฒˆ์ธ์— ๊ด€๋ จ๋œ ๋ฌธ์ œ์ ๋“ค๊ณผ ๋„์ „๊ณผ์ œ ”
Gabriel Tak
SEMICS
Gary Park
SEMICS
Rio Shin
SEMICS
Hans Bae
SEMICS
Abstract - Biography (English)

Since the development of electronic devices, the world has been undergoing rapid and efficient evolution. Among various fields, a crucial aspect currently facing us is "power semiconductors." SEMICS, as a global semiconductor manufacturing equipment company in Korea, we want to discuss the existing problems and explore potential alternatives within this realm.

Currently, many global power semiconductor chip manufacturers are striving to achieve the demanded level of quality while establishing efficient mass production systems. Our company, SEMICS has put considerable effort into contemplating the value we can provide to our customers and has been working on developing solutions that can meet all requirements. One of the outcomes we are proud of is an efficient and versatile solution for the Wafer Level Burn-In (WLBI) process, which is at least one of the challenges faced by engineers today.

This technology focuses on addressing the issues in the current WLBI process of SiC / GaN wafers and solving associated research tasks through SEMICS' unique approach. We believe you will understand how we can efficiently and accurately measure the status of die and generate valuable data to feedback front SiC wafer process for definitive improvement.

Gabriel Tak, Vice President of Product Marketing, is responsible for all technical marketing and sales activities across all product families at Semics.

Gabriel started his major and career in Electronic Engineering. He holds a bachelorโ€™s degree in electronic engineering from Kyungnam University and international management from HanYang Cyber University. Now he is studying in Marketing & Business management track in Hanyang MBA course.

Gabriel has 17 years of experience in the semiconductor industry holding progressive leadership roles in product marketing. He has joined in Semics in 2007 with starting his career as a system manufacturing & customer support engineer for the first 5 years, and he has an experience at field application engineer for next 5 years. Hobbies include golf, soccer, and scuba diving.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

์ „์ž ์žฅ์น˜์˜ ๋ฐœ์ „ ์ด๋ž˜๋กœ ์„ธ๊ณ„๋Š” ๋น ๋ฅด๊ณ  ํšจ์œจ์ ์ธ ์ง„ํ™”๋ฅผ ๊ฑฐ๋“ญํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ์—ฌ๋Ÿฌ ๋ถ„์•ผ ์ค‘ ํ˜„์žฌ ์šฐ๋ฆฌ ์•ž์— ์„ธ์›Œ์ง„ ์ค‘์š”ํ•œ ๋ฌธ์ œ ์ค‘ ํ•˜๋‚˜๋Š” "ํŒŒ์›Œ ๋ฐ˜๋„์ฒด"์ž…๋‹ˆ๋‹ค. ํ•œ๊ตญ์— ์œ„์น˜ํ•œ ์„ธ๊ณ„์ ์ธ ๋ฐ˜๋„์ฒด ์ œ์กฐ ์žฅ๋น„ ํšŒ์‚ฌ์ธ SEMICS๋Š” ์ด ๋ถ„์•ผ์—์„œ ๊ธฐ์กด์˜ ๋ฌธ์ œ์ ๋“ค์„ ๋…ผ์˜ํ•˜๊ณ  ์ž ์žฌ์ ์ธ ๋Œ€์•ˆ๋“ค์„ ํƒ์ƒ‰ํ•˜๊ณ ์ž ํ•ฉ๋‹ˆ๋‹ค.

ํ˜„์žฌ ๋งŽ์€ ๊ธ€๋กœ๋ฒŒ ํŒŒ์›Œ ๋ฐ˜๋„์ฒด ์นฉ ์ œ์กฐ์‚ฌ๋“ค์€ ์š”๊ตฌ๋˜๋Š” ํ’ˆ์งˆ ์ˆ˜์ค€์„ ๋‹ฌ์„ฑํ•˜๋ฉด์„œ ํšจ์œจ์ ์ธ ๋Œ€๋Ÿ‰ ์ƒ์‚ฐ ์‹œ์Šคํ…œ์„ ๊ตฌ์ถ•ํ•˜๊ธฐ ์œ„ํ•ด ๋…ธ๋ ฅํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ์šฐ๋ฆฌ ํšŒ์‚ฌ SEMICS๋Š” ๊ณ ๊ฐ์—๊ฒŒ ์ œ๊ณตํ•  ์ˆ˜ ์žˆ๋Š” ๊ฐ€์น˜์— ๋Œ€ํ•ด ์‹ฌ๋„ ์žˆ๊ฒŒ ๊ณ ๋ฏผํ•˜๊ณ , ๋ชจ๋“  ์š”๊ตฌ์‚ฌํ•ญ์„ ์ถฉ์กฑ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋Š” ํ•ด๊ฒฐ์ฑ…์„ ๊ฐœ๋ฐœํ•˜๊ธฐ ์œ„ํ•ด ๋…ธ๋ ฅํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ๊ทธ ๊ฒฐ๊ณผ๋กœ ์šฐ๋ฆฌ๋Š” ์˜ค๋Š˜๋‚  ์—”์ง€๋‹ˆ์–ด๋“ค์ด ์ง๋ฉดํ•˜๋Š” ์—ฌ๋Ÿฌ ๋„์ „ ์ค‘ ํ•˜๋‚˜์ธ Wafer Level Burn-In (WLBI) ๊ณผ์ •์— ๋Œ€ํ•œ ํšจ์œจ์ ์ด๊ณ  ๋‹ค์–‘ํ•œ ํ•ด๊ฒฐ์ฑ…์„ ๊ฐœ๋ฐœํ•  ์ˆ˜ ์žˆ์—ˆ์Šต๋‹ˆ๋‹ค.

์ด ๊ธฐ์ˆ ์€ SEMICS์˜ ๋…ํŠนํ•œ ๋ฐฉ๋ฒ•์„ ํ†ตํ•ด SiC / GaN ์›จ์ดํผ์˜ ํ˜„์žฌ WLBI ๊ณผ์ •์—์„œ์˜ ๋ฌธ์ œ์ ์„ ํ•ด๊ฒฐํ•˜๊ณ  ๊ด€๋ จ ์—ฐ๊ตฌ ๊ณผ์ œ๋ฅผ ํ•ด๊ฒฐํ•˜๋Š” ๋ฐ ์ค‘์ ์„ ๋‘ก๋‹ˆ๋‹ค. ์šฐ๋ฆฌ๋Š” ๋‹ค์ด์˜ ์ƒํƒœ๋ฅผ ํšจ์œจ์ ์ด๊ณ  ์ •ํ™•ํ•˜๊ฒŒ ์ธก์ •ํ•˜๊ณ  SiC ์›จ์ดํผ ์ œ์กฐ ๊ณต์ •์˜ ๊ทผ๋ณธ์ ์ธ ๊ฐœ์„ ์„ ์œ„ํ•ด ๊ฐ€์น˜ ์žˆ๋Š” ๋ฐ์ดํ„ฐ๋ฅผ ์ƒ์„ฑํ•˜์—ฌ ํ”ผ๋“œ๋ฐฑ ํ•˜๋Š” ๊ณผ์ •์„ ์ˆ˜๋ฆฝ ํ•จ์œผ๋กœ์จ ๋ณด๋‹ค ๊ทผ๋ณธ์ ์ธ ๊ฐœ์„ ์— ๋‹ค๊ฐ€๊ฐˆ ์ˆ˜ ์žˆ๋Š” ๋ฐฉ๋ฒ•์„ ์ œ๊ณต ํ•  ์ˆ˜ ์žˆ๋‹ค๊ณ  ๋ฏฟ์Šต๋‹ˆ๋‹ค.

ํƒํ˜„์ฃผ ๋ณธ๋ถ€์žฅ์€ ํ˜„์žฌ ์ด์‚ฌ๋กœ ๊ฒธ์ž„์„ ํ•˜๋ฉฐ, ใˆœ์Ž„๋ฏน์Šค์˜ ๋ชจ๋“  ์ œํ’ˆ๊ณผ ๊ธฐ์ˆ  ๋งˆ์ผ€ํŒ… ๋ฐ ์˜์—… ํ™œ๋™์„ ๋‹ด๋‹น.

  • ๊ฒฝ๋‚จ ์ •๋ณด ๋Œ€ํ•™๊ต ์ „์ž๊ณตํ•™๊ณผ (2007)
  • ํ•œ์–‘์‚ฌ์ด๋ฒ„๋Œ€ํ•™๊ต ๊ตญ์ œ๊ฒฝ์˜ํ•™๊ณผ ํ•™์‚ฌ (2012)
  • ํ•œ์–‘MBA๊ณผ์ • ๋งˆ์ผ€ํŒ… & ๋น„์ฆˆ๋‹ˆ์Šค ๊ฒฝ์˜ํ•™ ์ „๊ณต (ํ˜„์žฌ)
  • ๋ฐ˜๋„์ฒด ์ œํ’ˆ ๋งˆ์ผ€ํ„ฐ (17๋…„)
  • ์‹œ์Šคํ…œ ์ œ์กฐ ๋ฐ CS ์—”์ง€๋‹ˆ์–ด (5๋…„)

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15:15


Break & Networking

Enjoy time to meet with the presenters and network while refreshments are served.

15:45

Session 4
New Frontiers

“New Path to Narrow Pitch (0.1mm) Burn-in Socket Solution”
“์‹ ๊ฐœ๋… ํ˜‘ํ”ผ์น˜(0.1mm) ๋ฒˆ์ธ ์†Œ์ผ“ ์†”๋ฃจ์…˜”
YK Lee
Okins
Abstract - Biography (English)

Burn-in socket is made by assembling contact pins and housing either manually or automatically. The assembled burn-in socket is then mounted on a PCB by soldering or compression mount. However, current burn-in socket technology hits the wall at about 0.27mm pitch.

New burn-in socket technology is presented for small pitches, up to 0.10mm.

Path to smaller pitch:

Reducing the pitch beyond the present limit requires paradigm shift in the burn-in socket manufacturing process. Traditional burn-in sockets are assembled first with contacts and housing, before mounted to the PCB. For the new burn-in socket, contacts are first soldered to the PCB. Socket housing is then added.

Solder paste is applied to the contact surface before affixing the contact pin to the PCB. Laser bonding will then solder the contacts to the PCB.

Very small pitch can be achieved with this process. The process can be automated, reducing the socket defects and cost.

Benefits of the new burn-in socket solution:

Reduced defect & reduced waste. Traditional burn-in socket would have to be discarded if there is solder bridge (short circuit) or cold solder joint with the PCB during socket assembly. Attaching the contacts to the PCB before adding socket housing allows for pre-inspection and repair of solder bridge and cold solder. Final defect rate can approach zero with the new process.

Saving material. Separator plates are used in traditional burn-in socket, to reduce electrical shorts and ease manufacturability. The new burn-in socket can eliminate the separator plate, to reduce cost. Fast socket deployment. The new burn-in socket system allows new socket development without any high-cost die cast molding. Fast new socket development, without high fixed cost, is possible. A new socket can potentially be made in one day.

YK Lee current is in Okins Electronics BITS Department and is the Head of Laboratory leading Okins Electronics socket development since 2005. His experinece includes Semiconductor Burn-In Socket Development; Semiconductor SSD & Memory Module Socket Development; and High Speed connector Development.

He is a graduate of Mechanical Engineering at INHA University (2004).

์ดˆ๋ก - ์ „๊ธฐ (Korean)

๋ฒˆ์ธ ์†Œ์ผ“์€ Contact๊ณผ Housing์„ ์ˆ˜๋™ ๋˜๋Š” ์ž๋™์œผ๋กœ ์กฐ๋ฆฝํ•˜์—ฌ ์ œ์กฐ๋˜๋ฉฐ, ์กฐ๋ฆฝ๋œ ๋ฒˆ์ธ ์†Œ์ผ“์€ ๋‚ฉ๋•œ ๋˜๋Š” ๋ฉด ์ ‘์ด‰ ๋ฐฉ์‹์— ์˜ํ•ด PCB์— ์žฅ์ฐฉ๋˜์ง€๋งŒ, ํ˜„์žฌ ๋ฒˆ์ธ ์†Œ์ผ“์€ ์•ฝ 0.27mm pitch๋กœ ์ œ์ž‘ ํ•œ๊ณ„์— ๋ถ€๋”ชํ˜€ ์žˆ์Šต๋‹ˆ๋‹ค
์ตœ๋Œ€ 0.10mm์˜ ์ž‘์€ ํ”ผ์น˜๋ฅผ ์œ„ํ•œ ์ƒˆ๋กœ์šด ๋ฒˆ์ธ ์†Œ์ผ“ ๊ธฐ์ˆ ์„ ์ œ์‹œํ•ฉ๋‹ˆ๋‹ค

๋ฏธ์„ธ pitch์ œ์ž‘ ์†”๋ฃจ์…˜
ํ˜„์žฌ์˜ ํ•œ๊ณ„๋ฅผ ๋„˜์–ด์„œ๋Š” ํ”ผ์น˜๋ฅผ ์ค„์ด๊ธฐ ์œ„ํ•ด์„œ๋Š” ๋ฒˆ์ธ ์†Œ์ผ“ ์ œ์กฐ ํ”„๋กœ์„ธ์Šค์˜ ํŒจ๋Ÿฌ๋‹ค์ž„ ๋ณ€ํ™”๊ฐ€ ํ•„์š”ํ•ฉ๋‹ˆ๋‹ค. ์ „ํ†ต์ ์ธ ๋ฒˆ์ธ ์†Œ์ผ“์€ PCB์— ์žฅ์ฐฉ๋˜๊ธฐ ์ „์— ๋จผ์ € Contact๊ณผ Housing์œผ๋กœ ์กฐ๋ฆฝ๋ฉ๋‹ˆ๋‹ค. ์ƒˆ๋กœ์šด ๋ฒˆ์ธ ์†Œ์ผ“์˜ ๊ฒฝ์šฐ Contact์€ PCB์— ๋จผ์ € ๋‚ฉ๋•œ๋œ ํ›„์— ์†Œ์ผ“ ํ•˜์šฐ์ง•์ด ์ถ”๊ฐ€ ์กฐ๋ฆฝ๋ฉ๋‹ˆ๋‹ค
Contact์„ PCB์— ๋ถ€์ฐฉํ•˜๊ธฐ ์ „์— ์ ‘์ด‰ ํ‘œ๋ฉด์— ์†”๋” ํŽ˜์ด์ŠคํŠธ๋ฅผ ๋„ํฌํ•ฉ๋‹ˆ๋‹ค. ๊ทธ๋ฆฌ๊ณ  ๋‚˜์„œ ๋ ˆ์ด์ € ๋ณธ๋”ฉ์ด ์ ‘์ด‰ ํ•€์„ PCB์— ๋‚ฉ๋•œํ•˜๊ฒŒ ๋ฉ๋‹ˆ๋‹ค
์ด ๊ณต์ •์œผ๋กœ ๋ฏธ์„ธ ํ”ผ์น˜์˜ ๋ฒˆ์ธ ์†Œ์ผ“๋ฅผ ์ œ์ž‘ํ•  ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค. ๊ณต์ •์„ ์ž๋™ํ™”ํ•˜์—ฌ ์†Œ์ผ“ ๋ถˆ๋Ÿ‰ ๋ฐ ๋น„์šฉ๊นŒ์ง€๋„ ์ค„์ผ ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค.

์ƒˆ๋กœ์šด ๋ฒˆ์ธ ์†Œ์ผ“ ์†”๋ฃจ์…˜์˜ ์žฅ์ :
๋ถˆ๋Ÿ‰ ๊ฐ์†Œ ๋ฐ ํ๊ธฐ๋ฌผ ๊ฐ์†Œ. ๊ธฐ์กด ๋ฒˆ์ธ ์†Œ์ผ“์€ ์†Œ์ผ“ ์กฐ๋ฆฝ ์‹œ PCB์™€ ์†”๋” ๋ธŒ๋ฆฟ์ง€(๋‹จ๋ฝ) ๋˜๋Š” ๋ƒ‰๋‚ฉ์ด ์žˆ๋Š” ๊ฒฝ์šฐ ํ๊ธฐํ•ด์•ผ ํ•ฉ๋‹ˆ๋‹ค. ์‹ ๊ฐœ๋… ์ œ์ž‘ ๋ฐฉ์‹์„ ๋”ฐ๋ฅด๋ฉด ์†Œ์ผ“ ํ•˜์šฐ์ง•์„ ์ถ”๊ฐ€ํ•˜๊ธฐ ์ „์— PCB์— ์ปจํƒํŠธ๋ฅผ ๋ถ€์ฐฉํ•˜๋ฉด ์†”๋” ๋ธŒ๋ฆฟ์ง€ ๋ฐ ๋ƒ‰๋‚ฉ์˜ ์‚ฌ์ „ ๊ฒ€์‚ฌ ๋ฐ ์ˆ˜๋ฆฌ๊ฐ€ ๊ฐ€๋Šฅํ•ฉ๋‹ˆ๋‹ค. ์ตœ์ข… ๋ถˆ๋Ÿ‰๋ฅ ์€ ์ƒˆ๋กœ์šด ๊ณต์ •์œผ๋กœ โ€˜0โ€™์— ๊ฐ€๊นŒ์›Œ์งˆ ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค.
์†Œ์žฌ ์ ˆ์•ฝ. ์ข…๋ž˜์˜ ๋ฒˆ์ธ ์†Œ์ผ“์—๋Š” contact๊ฐ„ ์ˆํŠธ๋ฅผ ์ œ๊ฑฐํ•˜๊ณ  ์ œ์กฐ์„ฑ์„ ๋†’์ด๊ธฐ ์œ„ํ•ด ๋ถ„๋ฆฌํŒ(separator)์„ ์‚ฌ์šฉํ•ฉ๋‹ˆ๋‹ค. ์ƒˆ๋กœ์šด ๋ฒˆ์ธ ์†Œ์ผ“์€ ๋ถ„๋ฆฌํŒ(separator)์„ ์ œ๊ฑฐํ•  ์ˆ˜ ์žˆ์–ด ๋น„์šฉ์„ ์ ˆ๊ฐํ•  ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค.
๋น ๋ฅธ ์†Œ์ผ“ ์ „๊ฐœ. ์ƒˆ๋กœ์šด ๋ฒˆ์ธ ์†Œ์ผ“ ์‹œ์Šคํ…œ์€ ๊ณ ๋น„์šฉ์˜ ์‚ฌ์ถœ ์„ฑํ˜• ์—†์ด ์ƒˆ๋กœ์šด ์†Œ์ผ“ ๊ฐœ๋ฐœ์„ ๊ฐ€๋Šฅํ•˜๊ฒŒ ํ•ฉ๋‹ˆ๋‹ค. ๋†’์€ ๊ณ ์ • ๋น„์šฉ ์—†์ด ๋น ๋ฅธ ์ƒˆ๋กœ์šด ์†Œ์ผ“ ๊ฐœ๋ฐœ์ด ๊ฐ€๋Šฅํ•ฉ๋‹ˆ๋‹ค. ํ•˜๋ฃจ ์•ˆ์— ์ƒˆ๋กœ์šด ์†Œ์ผ“์„ ๋งŒ๋“ค ์ˆ˜ ์žˆ๋‹ค๊ณ  ์ž์‹ญํ•ฉ๋‹ˆ๋‹ค

BITS์‚ฌ์—…๋ถ€ ์—ฐ๊ตฌ์†Œ์žฅ
์˜คํ‚จ์Šค์ „์ž
* ์•ฝ๋ ฅ
(ํ˜„) ์˜คํ‚จ์Šค์ „์ž BITS์‚ฌ์—…๋ถ€ ์—ฐ๊ตฌ์†Œ์žฅ
์˜คํ‚จ์Šค์ „์ž ์†Œ์ผ“ ๊ฐœ๋ฐœ ๋‹ด๋‹น (2005 ~ )

์ธํ•˜๋Œ€ํ•™๊ต ๊ธฐ๊ณ„๊ณตํ•™๊ณผ ์กธ์—… (2004)

* ์—…๋ฌด ๋ถ„์•ผ

  • ๋ฐ˜๋„์ฒด Burn-In Socket ๊ฐœ๋ฐœ
  • ๋ฐ˜๋„์ฒด SSD, Memory Module ์†Œ์ผ“ ๊ฐœ๋ฐœ
  • High Speed connector ๊ฐœ๋ฐœ

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“Introduction of MEMS technology with the ceramic mold for Next-Generation test probes”
“Ceramic mold ์ ์šฉ MEMS process ๊ธฐ๋ฐ˜์˜ ์ฐจ์„ธ๋Œ€ ๋ฐ˜๋„์ฒด ์ „ํ›„๊ณต์ • ๊ฒ€์‚ฌ์šฉ MEMS ํ•ต์‹ฌ ๋ถ€ํ’ˆ ๊ฐœ๋ฐœ”
Seung Ho Park
Point Engineering
Abstract - Biography (English)

As the increasing a requirement of artificial intelligence (AI) and a huge of data, the process chips, such as processor, memory, and integrated circuits (ICs), became a higher level of integration. And it has faced demand on enhanced specifications โ€“ a higher process speed, a more compact size, etc.

The probe needles for the wafer test and the socket for package test are challenge points to meet functions โ€“ more delicate design and faster data gathering speed between the package and the system board in the narrow pad pitches.

The differentiated ceramic mold which is capable of precise anisotropic etching can used as a mold for fabricating probe needles. By applying this new material to MEMS technology, precise shapes (e.g spring shapes) even with very narrow gaps can be manufactured vertically straight with desired thickness(~130um).

We would like to introduce new MEMS technology for fabricating precise metal parts such as fine-pitch wafer test probe needles and differentiated spring pins for package test which can respond to the demand for next generation semiconductor inspection.

Seung-ho Park is a Material Engineer from point engineering, and he has been in Point engineering for 21 years as a head of R&D department of Point Engineering. He is pioneer for development of the PEC ceramic mold applicated MEMS process and invention of new products which can apply this new technology. SH Park received Ph.D., Master, BS degrees from the department of Materials & Metallurgical Engineering at Inha university in Korea.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

์ ์ฐจ ์ธ๊ณต์ง€๋Šฅ(AI)์ด ์ผ์ƒํ™”๋˜๊ณ  ๋ฐ์ดํ„ฐ์˜ ๊ทœ๋ชจ๊ฐ€ ์ฆ๊ฐ€๋˜๋ฉฐ 5G ํ†ต์‹ ์„ ํ†ตํ•œ ์Šค๋งˆํŠธํฐ, ์‚ฌ๋ฌผ์ธํ„ฐ๋„ท, ์ „๊ธฐ์ฐจ ๋“ฑ์˜ ์ปดํ“จํŒ…์ด ์ผ์ƒ์— ์ ์šฉ๋˜๋Š” ๋ฒ”์œ„๊ฐ€ ๋„“์–ด์ง€๊ณ  ์žˆ๋‹ค. ์ด์— ๋”ฐ๋ฅธ ๋ฐ˜๋„์ฒด์˜ ์ˆ˜์š”์™€ ๋น ๋ฅธ ์ฒ˜๋ฆฌ์†๋„ ์„ฑ๋Šฅ ์š”๊ตฌ๊ฐ€ ์ ์ฐจ ๋†’์•„์ง€๊ณ  ์žˆ๋‹ค. ๋ฐ˜๋„์ฒด ๊ธฐ์ˆ  ์ค‘ ์„ค๊ณ„์™€ ์ œ์กฐ๊ธฐ์ˆ ์ด ์ค‘์š”ํ•˜์ง€๋งŒ ์ด๋ฅผ ์ •๋ฐ€ํ•˜๊ฒŒ ํ™•์ธํ•˜๊ณ  ๊ฒ€์‚ฌํ•˜๋Š” ๊ธฐ์ˆ ์ด ๋ณด์™„๋˜์ง€ ์•Š์œผ๋ฉด ๋ฐ˜๋„์ฒด ์™„์„ฑํ’ˆ ์ œ์ž‘์ด ์–ด๋ ต๋‹ค. ์ฐจ์„ธ๋Œ€ ๋ฐ˜๋„์ฒด๋ฅผ ํ™•๋ณดํ•˜๊ธฐ ์œ„ํ•ด์„œ๋Š” ์ ์ฐจ ๋ฐฐ์„ ์˜ ๋ฐ€์ง‘๋„์™€ ํฌ๊ธฐ๊ฐ€ ์ž‘์•„์ง€๋Š” ๋ฐ˜๋„์ฒด ๊ฒ€์‚ฌ๊ธฐ์ˆ ๋„ ์ด์— ๋ถ€ํ•ฉํ•˜๋Š” ๊ธฐ์ˆ ๊ฐœ๋ฐœ์ด ํ•„์š”ํ•œ ์ƒํ™ฉ์ด๋‹ค.
๋ฐ˜๋„์ฒด ๊ฒ€์‚ฌ์—์„œ ๋ฐ˜๋„์ฒด ํŒจ๋“œ์™€ ์ง์ ‘ ์ „๊ธฐ์ ์œผ๋กœ ์—ฐ๊ฒฐํ•˜๋Š” ํ”„๋กœ๋ธŒ ํ•€(probe pin), ๊ทธ๋ฆฌ๊ณ  ๋ฐ˜๋„์ฒด ํŒจํ‚ค์ง€๋ฅผ ๊ฒ€์‚ฌํ•˜๊ธฐ ์œ„ํ•œ ์†Œ์ผ“(socket)์€ ์ ์ฐจ ํ˜‘ํ”ผ์น˜๋กœ ์ž‘์•„์ง€๋ฉด์„œ ์ •๋ฐ€ํ•ด์ง€๊ณ  ๊ณ ์˜จ ๋ฐ ๊ณ ์ฃผํŒŒ ํ™˜๊ฒฝ์— ์‹ ๋ขฐ์„ฑ ํŠน์„ฑ์ด ์š”๊ตฌ๋˜๊ณ  ์žˆ๋‹ค.
์ด๋Ÿฌํ•œ ์ฐจ์„ธ๋Œ€ ๋ฐ˜๋„์ฒด ์ œ์กฐ๋ฅผ ์œ„ํ•œ ๊ฒ€์‚ฌ์˜ ํ•ต์‹ฌ๋ถ€ํ’ˆ์ธ ํ”„๋กœ๋ธŒ ํ•€๊ณผ ์†Œ์ผ“ ์ œ์ž‘์€ ๊ธฐ์กด PR(photo-register)์„ ์ด์šฉํ•œ ๋„๊ธˆ๊ณต์ •์œผ๋กœ ์ œ์ž‘ํ•˜์˜€์œผ๋‚˜ ์ •๋ฐ€ํ•˜๊ณ  ๊ณ ์ข…ํšก๋น„์˜ ํ•€ ์ œ์ž‘์— ํ•œ๊ณ„๊ฐ€ ์žˆ๋‹ค.
PEC์˜ ์ฐจ๋ณ„ํ™”๋œ Ceramic mold๋Š” ์ •๋ฐ€ํ•œ ์ด๋ฐฉ์„ฑ ์—์นญ์ด ๊ฐ€๋Šฅํ•œ ์†Œ์žฌ๋กœ ๊ธฐ์กด PR์˜ ๋‹จ์ ์„ ๋ณด์™„ํ•˜๊ณ  ์ •๋ฐ€ํ•œ ํ•€ ์ œ์ž‘์ด ๊ฐ€๋Šฅํ•˜๋‹ค. ์ด๋Ÿฌํ•œ ์†Œ์žฌ๋ฅผ ์ด์šฉํ•œ ์ •๋ฐ€ ๊ธˆ์† ๋ถ€ํ’ˆ์˜ ์ œ์ž‘ ๊ธฐ์ˆ ๊ณผ ์„ฑ๋Šฅ์„ ํ†ตํ•ด ์ฐจ์„ธ๋Œ€ ๋ฐ˜๋„์ฒด ๊ฒ€์‚ฌ์— ๋Œ€์‘ ๊ฐ€๋Šฅํ•œ ํ•ต์‹ฌ๋ถ€ํ’ˆ ์ œ์กฐ ๊ธฐ์ˆ ์„ ์ œ์•ˆํ•˜๊ณ ์ž ํ•œ๋‹ค.

๋ฐ•์Šนํ˜ธ ์—ฐ๊ตฌ์†Œ์žฅ์€ ๊ธˆ์†๊ณตํ•™ ์—”์ง€๋‹ˆ์–ด์ด์ž ํฌ์ธํŠธ์—”์ง€๋‹ˆ์–ด๋ง์˜ R&D ๋ถ€๋ถ„์˜ ์—ฐ๊ตฌ์†Œ์žฅ์œผ๋กœ ์•ฝ 21๋…„ ๊ฐ„์˜ ์กฐ์ง์„ ์ด๋ˆ ๊ฒฝ๋ ฅ์„ ๋ณด์œ ํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. ํฌ์ธํŠธ์—”์ง€๋‹ˆ์–ด๋ง์—์„œ Ceramic mold์˜ ํŠน์„ฑ ๋ฐ ์ œ์กฐ์— ๋Œ€ํ•œ ์ง€์†์ ์ธ ์—ฐ๊ตฌ๋กœ ํ•ด๋‹น material๋ฅผ ํ™œ์šฉํ•œ MEMS ๊ณต์ •์„ ๊ฐœ๋ฐœํ•œ ์ฃผ์š” ์—ฐ๊ตฌ์ž์ด๋ฉฐ, ํ•ด๋‹น ๊ธฐ์ˆ ์„ ์ ์šฉํ•œ ๋‹ค์–‘ํ•œ ๋ฏธ์„ธ ๋ถ€ํ’ˆ์„ ๊ฐœ๋ฐœํ•˜๊ณ  ์ œ์กฐ ๊ณต์ •์„ ์ˆ˜๋ฆฝํ•˜์˜€์Šต๋‹ˆ๋‹ค. ๋ฐ•์Šนํ˜ธ ์—ฐ๊ตฌ์†Œ์žฅ์€ ์ธํ•˜๋Œ€ํ•™๊ต ๊ธˆ์†๊ณตํ•™ ๋ถ„์•ผ์˜ ํ•™์‚ฌ, ์„์‚ฌ, ๋ฐ•์‚ฌ ํ•™์œ„๋ฅผ ๋ณด์œ ํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค.

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“Schematic AI Extractor”
“์‹ AI ์ถ”์ถœ๊ธฐ”
Siang Hui Kiu
Intel
See Tien "Angie" Ng
Intel
Zhe Jin Lee
Intel
Yen Ming "Jason" Siaw
Intel
Abstract - Biography (English)

The presentation introduces Schematic AI Extractor and how it assists the reviewer in reviewing and mining the data from schematic file. A schematic file usually contains lots of interfaces such as audio, display, memory, and so on. For each interface, there are details such as vendor, part number, voltage, technology type, and so on to be extracted. The Schematic AI Extractor can reduce some of the manual labour from the reviewer. The Schematic AI Extractor provides automatic extraction along with AI to interpret the extracted data of the components. Next, the details will filter using a similarity checking character by character with a threshold value method and a master list that contains details of the components. Once everything is passed, will be exported to a custom Excel sheet used by the reviewer.

Angie See Tien Ng is an AI Principal Engineer from Intel, who is the pioneer for Cloud based Remote Debug (CBRD), and spearheaded AI Chat bot. She has been in Intel for 14 years and in the industry for 26 years. Her career includes AI, R&D electronics design, RF designer, FPGA IC characterization, Electrical Validation, Functional Safety etc. Angie is always passionate in innovation and is honoured with Distinguished Invention Award by Intel. She graduated from Campbell University with BEng in Microelectronics/Physics in 1997, obtained her Master in Engineering from Multimedia University in 2014 and completed her PHD doctorate from University Science Malaysia in 2021 in area of designing Cloud-based virtual learning & testing for industry.

Yen Ming Siaw is a Cloud Application Engineer from Intel who is leading the Intel Penang Site Developer Cloud and involved in various AI initiatives including the AI Virtual Chat Bot. He has been in Intel for 8 years and in the industry for 10 years. (Motorola, Intel). His career includes Technical Support, Design & Electrical Validation, Firmware Validation and Software Development. He graduated from University of Bradford UK with BEng in Electrical and Electronics Engineering in 2013.

์ดˆ๋ก - ์ „๊ธฐ (Korean)

ํ•ด๋‹น ๋ฐœํ‘œ์—์„œ๋Š” ๋„์‹ AI ์ถ”์ถœ๊ธฐ ๋ฐ ํ•ด๋‹น ๊ธฐ์ˆ ์ด ์–ด๋–ป๊ฒŒ ๊ฒ€ํ† ์ž๊ฐ€ ํšŒ๋กœ๋„ ํŒŒ์ผ์˜ ๋ฐ์ดํ„ฐ๋ฅผ ๊ฒ€ํ† ํ•˜๊ณ  ๋งˆ์ด๋‹ํ•˜๋Š”๋ฐ ๋„์›€์„ ์ฃผ๋Š”์ง€ ์†Œ๊ฐœํ•ฉ๋‹ˆ๋‹ค. ํšŒ๋กœ๋„ ํŒŒ์ผ์€ ์ผ๋ฐ˜์ ์œผ๋กœ ์˜ค๋””์˜ค, ๋””์Šคํ”Œ๋ ˆ์ด, ๋ฉ”๋ชจ๋ฆฌ ๋“ฑ ๋‹ค์–‘ํ•œ interface๋ฅผ ํฌํ•จํ•˜๋ฉฐ, ๊ฐ interface๋งˆ๋‹ค ๊ณต๊ธ‰์—…์ฒด, ๋ถ€ํ’ˆ ๋ฒˆํ˜ธ, ์ „์••, ๊ธฐ์ˆ  ์œ ํ˜• ๋“ฑ ์ถ”์ถœํ•œ ์„ธ๋ถ€ ์ •๋ณด๊ฐ€ ์กด์žฌํ•ฉ๋‹ˆ๋‹ค. ๋„์‹ AI ์ถ”์ถœ๊ธฐ๋Š” AI์™€ ํ•จ๊ป˜ ๊ฐ ์š”์†Œ์— ๋Œ€ํ•œ ์ •๋ณด๋ฅผ ์ž๋™์œผ๋กœ ์ถ”์ถœํ•˜๋ฉฐ ์ถ”์ถœ๋œ ๊ตฌ์„ฑ์š”์†Œ์— ๋Œ€ํ•œ ํ•ด์„์„ ์ œ๊ณตํ•˜์—ฌ ๊ฒ€ํ† ์ž์˜ ์ˆ˜์ž‘์—…์„ ์ค„์ผ ์ˆ˜ ์žˆ์Šต๋‹ˆ๋‹ค. ๋‹ค์Œ์œผ๋กœ, ์„ธ๋ถ€ ์ •๋ณด๋Š” threshold value method ๋ฐ ๊ตฌ์„ฑ์š”์†Œ์— ๋Œ€ํ•œ ์„ธ๋ถ€ ์ •๋ณด๊ฐ€ ํฌํ•จ๋œ master list๋ฅผ ๊ธฐ๋ฐ˜์œผ๋กœ ๋ฌธ์ž ๋ณ„ ์œ ์‚ฌ์„ฑ ๊ฒ€์‚ฌ๋ฅผ ์‚ฌ์šฉํ•˜์—ฌ ํ•„ํ„ฐ๋ง ๋ฉ๋‹ˆ๋‹ค. ๋ชจ๋“  ๊ฒƒ์ด ํ†ต๊ณผ๋˜๋ฉด, ๊ฒ€ํ† ์ž๊ฐ€ ์‚ฌ์šฉํ•˜๋Š” ์‚ฌ์šฉ์ž ์ •์˜ Excel sheet๋กœ ์ •๋ณด๊ฐ€ ๋‚ด๋ณด๋‚ด์ง‘๋‹ˆ๋‹ค.

Angie See Tien Ng ๋Š” Intel์˜ AI ์ˆ˜์„ ์—”์ง€๋‹ˆ์–ด๋กœ ํด๋ผ์šฐ๋“œ ๊ธฐ๋ฐ˜ ์›๊ฒฉ Debug(CBRD) ๋ฐ AI์ฑ—๋ด‡ ๊ฐœ๋ฐœ์„ ์ฃผ๋„ํ•˜์˜€์Šต๋‹ˆ๋‹ค. Dr.Angie๋Š” Intel ๋‚ด 14๋…„์˜ ๊ฒฝ๋ ฅ์„ ํฌํ•จํ•˜์—ฌ ํ•ด๋‹น industry์—์„œ ์ด 26๋…„์˜ ๊ฒฝ๋ ฅ์„ ๊ฐ€์ง€๊ณ  ์žˆ์œผ๋ฉฐ, AI, R&D electronics ๋ฐ RF ์„ค๊ณ„, FPGA IC characterization, Electrical Validation, Functional Safety ๋ถ„์•ผ์—์„œ ๊ฒฝ๋ ฅ์„ ํฌํ•จํ•ฉ๋‹ˆ๋‹ค. Dr.Angie๋Š” ํ˜์‹ ์— ์—ด์ •์ ์ธ Engineer๋กœ Intel์—์„œ Distinguished Invention Award๋ฅผ ์ˆ˜์ƒํ•œ ์ด๋ ฅ์ด ์žˆ์Šต๋‹ˆ๋‹ค.
Angie๋Š” 1997๋…„ Campbell University๋‚ด ๋งˆ์ดํฌ๋กœ์ „์ž๊ณตํ•™/๋ฌผ๋ฆฌํ•™ ํ•™์‚ฌ ํ•™์œ„, 2014๋…„ Multimedia University ๋‚ด ๊ณตํ•™ ์„์‚ฌ ํ•™์œ„, 2021๋…„ University Science Malaysia์—์„œ ํด๋ผ์šฐ๋“œ ๊ธฐ๋ฐ˜ virtual learning & testing ์„ค๊ณ„ ๋ถ„์•ผ์—์„œ ๋ฐ•์‚ฌ ํ•™์œ„๋ฅผ ์ทจ๋“ํ•˜์˜€์Šต๋‹ˆ๋‹ค.

Siaw Yen Ming ๋Š” Intel์˜ Cloud Application ์—”์ง€๋‹ˆ์–ด๋กœ Intel Penang site Developer Cloud๋ฅผ ์ฃผ๋„ํ•˜์˜€์œผ๋ฉฐ, AI ๊ฐ€์ƒ ์ฑ—๋ด‡ ๊ฐœ๋ฐœ์„ ๋น„๋กฏํ•œ ๋‹ค์–‘ํ•œ AI initiative์— ์ฐธ์—ฌํ•˜๊ณ  ์žˆ์Šต๋‹ˆ๋‹ค. Intel ๋‚ด 8๋…„์˜ ๊ฒฝ๋ ฅ์„ ํฌํ•จํ•˜์—ฌ ํ•ด๋‹น industry์—์„œ ์ด 10๋…„(Motorola, intel)์„ ๊ฐ€์ง€๊ณ  ์žˆ์œผ๋ฉฐ, ๊ธฐ์ˆ ์ง€์›, ์„ค๊ณ„ ๋ฐ Electrical Validation, Firmware Validation, ๋ฐ Software ๊ฐœ๋ฐœ ๋ถ„์•ผ์—์„œ์˜ ๊ฒฝ๋ ฅ์„ ํฌํ•จํ•ฉ๋‹ˆ๋‹ค.
Siaw๋Š” 2013๋…„ University of Bradford UK ๋‚ด ์ „๊ธฐ์ „์ž๊ณตํ•™ ๋ถ„์•ผ ํ•™์‚ฌ ํ•™์œ„๋ฅผ ์ทจ๋“ํ•˜์˜€์Šต๋‹ˆ๋‹ค.

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