Pin Savers: Enabling ATE testing 81GHz mmWave RFCOM SoC Device

Virtual Event Index
Session 4
Total Solutions
Test Cell Integration & Automated Test Equipment
“Pin Savers: Enabling ATE testing 81GHz mmWave RFCOM SoC Device”
Attendee Choice
Guor-Chaur Jung
Texas Instruments
James "Mr. T" Tong
Texas Instruments
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