"High Speed Testing"
"高频测试"
Jackie Luo
Shanghai Zenfocus Semi-Tech Co., Ltd
"Flat Probe Technology for RF Test"
"高频测试用扁平型探针"
Dongmei Han
Xcerra
Jason Mroczkowski
Xcerra
Nadia Steckler
Xcerra
"Coplanar Waveguide On Wafer Calibration Technology for Enabling High Volume Microwave On-Wafer Test"
"共面波导在片校准技术使微波集成电路在片量测成为可能"
Yuzhe Yin
China Electronics Standardization Institute
"DUT ATE Test Fixture S-Parameters Estimation using 1x-Reflect Methodology"
"采用 1x-反射法解析芯片自动测试夹具的 S-参数"
Jose Moreira
Advantest
Ching-Chao Huang
AtaiTec Corporation
Derek Lee
Nvidia
"Contactor Arcing Fundamentals"
"触点拉弧基础"
Yoinjun Shi
TwinSolution
Return to the 2017 BiTS China Workshop Archive index page