"Implementation Challenges of an ATE Test Cell for At-Speed Production Test of 32 Gbps Applications"
"32 Gbps速度应用在自动测试单元量产实施中的挑战"
Jose Moreira
Advantest
Hubert Werkmann
Advantest
Daniel Lam
Advantest
Bernhard Roth
Advantest
"Addressing Challenges in High Temperature Burn-In"
"高温老化测试挑战的讨论"
Paolo Rodriguez
Analog Devices Philippines
"Derating Transient Voltage Suppressor Diodes for Burn-In Applications"
"老化测试中瞬态电压抑制器的降额设计"
Gil Conanan
Analog Devices Philippines
Rolando Reyes
Analog Devices Philippines
"An Ignorable Testing Technology for High Speed/Frequency Device Testing"
"一个不容忽视的高速芯片测试方法"
Pang Cheng Chiu
Jthink Technology
Sung Mao Wu
National University of Kaohsiung
Lung Shu Huang
Jthink Technology
Kuan-I Cheng
National University of Kaohsiung
Chih-Cheng Chuang
National University of Kaohsiung
Return to the 2016 BiTS China Workshop Archive index page