It's been three and a half days packed with learning, exploring, and sharing. Before we pack our bags and take what we've learned back to our jobs, there are a few closing remarks. We will take a moment to reflect and recognize the people, presentations, and posters that have distinguished themselves at BiTS 2015.
Awards
Best Poster
"Advanced Kelvin Test Solution for Wafer Level Chip Packages"
Jay Kim
Leeno Industrial Inc.
Best Data
"PCB Test Fixture and DUT Socket Challenges for 32 Gbps/GBaud ATE Applications"
Jose Moreira
Advantest
Christian Borelli, Fulvio Corneo
STMicroelectronics
Most Inspirational Presentation
"APEX Glass for Burn-In and Test Sockets"
Jeb H. Flemming, Tim Foster
3D Glass Solutions, Inc.
Best Presentation - Tutorial
"Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts"
Valts Treibergs
Xcerra Corporation
Attendee Choice
"BURst Pressure (BURP) Stress Test for MEMS Pressure Sensors"
Peter Jones & Ray Sessego
Freescale Semiconductor
Best Paper/Presentation
"Designing Sockets for Ludicrous Speed (80 GHz)"
Don Thompson
R&D Altanova
Jose Moreira
Advantest
Presentation Download
Return to the 2015 BiTS Workshop Archive index page