Session 8 – Looking For That Four Leaf Clover

In this second test cell integration session, we hear specialized test solutions that target very specific requirements. Jason Mroczkowski, Xcerra, describes a complete test cell for high volume manufacturing (HVM) that meets the challenges of RF testing for next generation automotive radar devices. Bob Bartlett, Advantest, describes a universal device interface (UDI) framework that can be used by test engineers to quickly integrate any kind of PCB evaluation board or device interface for characterization, bring-up, and HVM. Roger Sinsheimer, Teradyne, explains how to extend existing ATE test instruments in new ways for specialized test requirements for niche markets solutions.

"A Test-Cell-Solution for 81GHz Automotive Radar ICs"
Jason Mroczkowski, Peter Cockburn, John Shelley
Xcerra Corporation

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"Universal Device Interface DUT Solutions for ATE Test"
Bob Bartlett
Advantest Corporation

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"Where No Tester Has Gone Before"
Roger Sinsheimer
Teradyne Inc.

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