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Session 7 – Feel the Burn-In
Burn-in is used to ensure a device's reliability and lifetime. The two papers in this final session look at parallel burn-in methods. The first presents an overview of built-in IC test and monitoring methods and describes the access buses for these test and monitor methodologies. It will also describe a hardware and software framework that exploits these test technologies for the massively parallel burn-in and test of 100's of complex ICs. The second presents some interesting challenges along the road to parallel burn-in test. It will include design requirements and rules to optimize the overall device power consumption; and go one step further on managing the unexpected challenges."Massively Parallel Burn-in Test using IC Serial Buses"
Billy Fenton
OLAS Consulting
Pat Mitchell
Accutron
"Challenges of Increasing Parallelism in Burn-in Testing"
Yeow Hock Low
Infineon Technologies Asia Pacific
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